Zusammenfassung
To reach decarbonization goals of net-zero carbon emissions by 2050, an unprecedented increase in solar photovoltaic (PV) production and deployment is required in the forthcoming years. It is estimated that 63.4 TW of PV needs to be installed worldwide, a more than 60-fold increase from the currently installed 1 TW.Metal halide perovskite solar cells (PSC) are an emerging thin-film PV technology projected to play an important role in the terawatt-level PV deployment, either as a competitive alternative or tandem partner to the mature crystalline silicon (c-Si) technology. PSCs gained significant interest in recent years with remarkable and unprecedented power conversion efficiencies that have reached 26.1% for single-junction solar cell in only over a decade of research. Other advantages of PSCs include lower costs and simplicity of fabrication, adaptability to large-area processing, and compatibility with other PV technologies for tandem application. Efforts on fabricating tandem devices enabled by the tunability of PSC bandgap are gaining popularity due to promised reduction of $/W, with the EPFL PVlab standing at the forefront of this research. The current record efficiency of c-Si/PSC tandems is 33.9%, and several companies (e.g., Oxford PV, Hanwha Q Cells, etc.) are attempting to commercialize the technology.With this aim in mind, research focus is progressively shifting from pursuing PSC efficiencies to stability studies, as scalability, manufacturability and durability of the technology are lagging behind their laboratory-scale success. The lack of long-term operational stability in the outdoor environment is currently the major hurdle and technological barrier to commercialization. In this framework, the proposed project entitled ‘Failure analysis of PErovskite-based modules towArd long-term field ReliabiLity’ (PEARL) aims to address current challenges and bottlenecks in perovskite-based module reliability by applying lessons learnt from commercial c-Si PV technology and develop appropriate encapsulation and failure analysis strategies. Besides the susceptibility to moisture and oxygen that can be prevented by introducing adequate encapsulation techniques, some of the main degradation modes include thermal degradation, light-induced degradation, potential-induced degradation (PID), reverse-bias degradation from partial shading, mechanical delamination, and (electro)-chemical corrosion. Stressors such as light (including ultraviolet (UV)), temperature, and bias induce chemical reactions and/or elemental migrations through interfaces in cells and encapsulated modules, resulting in severe and irreversible power loss. Modifications in PSC device stack, compositional changes, and additive doping are explored as paths to enhance PSC stability. However, the multitude of possible device and module architectures, interfaces, and compositions are making our understanding of PSC reliability challenging.Proper encapsulation of perovskite devices is essential; however, typical PV encapsulation strategies involve the use of elevated temperatures, and polymeric materials producing volatile products and possibly reactions harmful to PSC during lamination or operation lifetime. Glass/glass with desiccated edge seal with or without a sheet of transparent polymeric encapsulant were proposed to encapsulate perovskites. However, as of now, there are only a few durability studies providing fundamental understanding of the degradation mechanisms in encapsulated perovskite-based cells or modules. To this end, efforts are made to design and standardize accelerating testing for perovskites, such as the International Summit on Organic Photovoltaic Stability (ISOS) protocols. Accelerated stress tests aim to reproduce field failure and the US-based Perovskite PV Accelerator for Commercializing Technology (PACT) plays an important role to bridge the gap between the outdoor and indoor performance by providing independent testing and validation of the fielded module performance and develop standardized testing protocols for perovskite modules.Scaling up from cell to module reveals additional weaknesses of the technology, including processing heterogeneities, vulnerabilities from connecting individual cells, and greater mechanical stresses at the interfaces. Introducing a polymeric encapsulant into the module may have two-fold consequences: a low-modulus encapsulant would provide mechanical support reducing risk of delamination; however, introduction of additional interfaces may cause elemental migrations and interactions-in particular between encapsulant additives and the cell stack. For example, PV encapsulants play an important role in power loss of c-Si modules, typically from action of UV and bias resulting in decomposition and interaction of UV absorbing additives and interfacial elemental migrations, respectively.Proper methodologies to characterize degradation on a module-level are yet to be developed. The challenges arise from sensitivity of the materials requiring delicate handling and an inert atmosphere. Strategies to deconstruct c-Si and thin-film CdTe and CIGS modules are in place, but these technologies are significantly more robust and environmentally stable.In the proposed work, I would like to address the above-described challenges to perovskite reliability with lessons learnt from c-Si PV. In the three operational work packages of the project (module fabrication, stress testing, and destructive analysis) I will (1) optimize perovskite module packaging with suitable materials and methods, transferable from single- to multi-junction module architectures, (2) monitor degradation rates during accelerated UV weathering and outdoor aging focusing on effects of module encapsulation, (3) develop destructive methodology to extract module areas of interest for characterization, and finally (4) elucidate degradation mechanisms through advanced material characterization.The unique aspect of this study relies in developing a damage-free module packaging and dismantling strategy adaptable to a variety of perovskite-based single- or multi-junction architectures. Because perovskite technology advances fast with module and layer composition and designs constantly changing and improving, the transferability of the approach to study degradation mechanisms is key. Among the few publications on perovskite module stability, there are hardly any focusing on understanding the failure on a module level, and none on analyzing a cross-section of a full module stack. Finally, UV weathering studies of perovskites have been largely neglected due to eliminating UV-sensitive layers such as TiO2, and SnO2 or possibility of using UV-blocking encapsulants. However, UV is one of the most severe stress factors affecting c-Si modules, causing photo-oxidative degradation of PV encapsulants. Addressing these steps is critical to advance perovskites a step closer to commercialization and may be also valuable for their application in different fields.